The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2001
Filed:
Nov. 23, 1998
Mark J. Greisz, Vancouver, WA (US);
Seh America, Vancouver, WA (US);
Abstract
An apparatus and method for inspecting the quality of a Nd-YAG laser beam after encountering an optic in a laser marking machine is provided. The apparatus includes a bezel that houses a filter medium that significantly increases the visible power intensity between the threshold-of-visibility to the point of saturation of a beam when viewed with an infrared electroviewer. The apparatus of the present invention is held in the path of the laser beam, and the beam is inspected with an infrared electroviewer. Occlusions in the power range of the beam found between the increased range of threshold-of-visibility to saturation point caused by imperfections in the optics can then be seen with an infrared electroviewer.