The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2001
Filed:
Mar. 26, 1999
Mitutoyo Corporation, Tokyo, JP;
Abstract
A micrometer includes: a main body having an anvil at one end thereof, a spindle having a screwed portion engaging an opposite end of the main body and being displaceable in an axial direction and with respect to the anvil in conjunction with rotation of the spindle, and an encoder detecting an axial displacement amount of the spindle from a rotation amount of the spindle, so that a measurement value based on an output signal of the encoder is digitally displayed. The micrometer includes a thimble provided on the opposite end of the main body and the thimble is rotatable about the axis of the spindle at a predetermined position in the axial direction of the spindle. The thimble is formed with a guide groove parallel with the axial direction of the spindle in an inner peripheral surface thereof. The spindle includes an engagement pin located in the spindle and slidably engaging with the guide groove of the thimble.