The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2001
Filed:
Jul. 21, 1999
Applicant:
Inventors:
Tadashi Kainuma, Tokyo, JP;
Noboru Masuda, Tokyo, JP;
Haruki Nakajima, Tokyo, JP;
Noriyuki Igarashi, Tokyo, JP;
Yuichi Nansai, Tokyo, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01N 2/500 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01N 2/500 ;
Abstract
An IC testing apparatus,for performing a test by applying at least a low temperature stress to ICs to be tested comprising a refrigerant cycle,wherein at least a compressor,, condenser,, expansion valve,and evaporator,are connected in this order, and a cold air applying line,having a blower,for supplying heat exchanged cold air by the evaporator,to the ICs to be tested.