Ellipsometer and ellipsometry method

Abstract

An improved ellipsometry method and a self-correcting simultaneous multiple angle/multiple wavelength return path ellipsometer are disclosed which allow for simultaneous measurement at multiple angles of incidence in a manner which permits separation of instrument error from the measured properties. In the method polarized light from a single beam of light is simultaneously directed to interact with an optical system under study at different angles of incidence and the change of polarization state is measured for at least one and preferably each of a plurality of the angles of incidence. Non-sample optical system ellipsometric effects of the ellipsometer are measured and the measured changes in polarization state are corrected to eliminate errors introduced thereby. The disclosed embodiment is self-correcting by way of a convex reflector which can be inserted into and removed from the optical path of the beam of polarized light between a focusing optic and the sample optical system under study. The convex reflector when inserted into the optical path causes the light rays of the beam of polarized light in each of the plurality of angles of incidence to retrace its path through the focusing optic for detection by a detector array without undergoing reflection and re-reflection as during a sample measurement configuration of the ellipsometer where the convex reflector is removed from the optical path.