The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Aug. 04, 1999
Applicant:
Inventors:

Nicholas J. Heaton, Houston, TX (US);

Dylan H. Davies, Sugar Land, TX (US);

M. Reza Taherian, Stafford, TX (US);

Boqin Q. Sun, Sugar Land, TX (US);

Abdurrahman Sezginer, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A magnetic resonance measurement apparatus that is subject to relative motion between the apparatus and a specimen along a path includes a magnet, antennae and a circuit. The magnet polarizes the specimen, and the antennae are spatially distributed along the path. The circuit uses the antennae to perform magnetic resonance measurements and use the spatial distribution of the antennae to establish different polarization times for the magnetic resonance measurements.


Find Patent Forward Citations

Heaton, Nicholas. (2001). Method and apparatus for performing magnetic resonance measurements (U.S. Patent No. 6255818). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6255818

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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