The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2001

Filed:

Jul. 16, 1999
Applicant:
Inventors:

Wei-Sheng Lai, Chu-Pei, TW;

Yu-Ching Chang, Hsin-Chu, TW;

Chun-Hu Ge, Hsin-Dien, TW;

Chih-Ming Chen, Yam Mei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/131 ;
U.S. Cl.
CPC ...
H01L 2/131 ;
Abstract

A method to provide low dielectric constant voids between adjacent conducting lines in a semiconductor device. Narrowly spaced metal lines are formed on the substrate surface. A dielectric layer is deposited overlying the metal lines and the substrate surface. A high water content, water saturated, environment is created for the spin-on-glass process. A pseudo-water condition exists on the surface of the dielectric layer prior to the deposition of the spin-on-glass layer. The spin-on-glass layer is deposited overlying the dielectric layer. Voids form in the spin-on-glass layer between the narrowly spaced metal lines. The spin-on-glass layer is baked. The integrated circuit device is completed.


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