The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Dec. 28, 1999
Applicant:
Inventor:

Chin-Kai Liu, Taichung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1311 ;
U.S. Cl.
CPC ...
H01L 2/1311 ;
Abstract

A new method is provided for the creation of interfacing and adjacent surfaces when creating damascene interconnects. Under the first embodiment of the invention, the surface area of the Intra Metal Dielectric (IMD) in which the copper metal pattern has been created is partially removed thereby reducing and sub-dividing the surface area of the interfacing surface. Under the second embodiment of the invention, the surface area of the IMD is sub-divided into a multiplicity of squares that now form the interfacing surface area. Under the third embodiment of the invention, the surface area of the Intra Metal Dielectric (IMD) in which the copper metal pattern has been created is essentially removed leaving sidewalls of the IMD material on the formed pattern of copper interconnects.


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