The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Dec. 07, 1999
Hisayuki Kohno, Takatsuki, JP;
Shirou Higaki, Takatsuki, JP;
Rigaku Industrial Corporation, Osaka, JP;
Abstract
A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (,) carried by a first spindle (,) having a longitudinal axis (O) passing in touch with a light receiving surface of the monochromator (,). A first detector (,A) for measuring the intensity of at least a portion of the secondary X-ray (,) monochromatized by the monochromator (,) while allowing the remaining portion of the secondary X-ray (,) to pass therethrough, and a light receiving slit member (,) for passing the secondary X-ray (,) monochromatized by the monochromator (,) therethrough are carried by a second spindle (,) in side-by-side relation in a circumferential direction. A third spindle (,) is utilized separate from the second spindle (,) for carrying a second detector (,B) for measuring the intensity of the secondary X-ray (,) having passed through the first detector (,A) or the light receiving slit member (,).