The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2001

Filed:

Jul. 21, 1999
Applicant:
Inventor:

Kwok Tam, Edison, NJ (US);

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

A scanning and data acquisition method and apparatus for three dimensional (3D) computerized tomography (CT) imaging of an ROI in an object, wherein a reconstructed image is developed by calculating reconstruction data along a plurality of line segments L formed in cone beam data acquired on a detector at a plurality of source positions about the ROI. The endpoints of the line segments L formed in the cone beam data acquired at each of the source positions is determined by a data combination mask which is applied to the cone beam data. When acquiring cone beam data near the top or bottom edges of the ROI, a radiation blocking element is operated for blocking radiation directed toward the ROI, so that only that portion of the detector is exposed to radiation.


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