The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2001

Filed:

Mar. 31, 1998
Applicant:
Inventors:

Michael C. McSherry, Portland, OR (US);

Richard E. Strobel, Vancouver, WA (US);

Robert A. Todd, Tigard, OR (US);

Paul M. Nguyen, Beaverton, OR (US);

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06S 1/750 ;
U.S. Cl.
CPC ...
G06S 1/750 ;
Abstract

A data extraction tool is provided to extract filtered connectivity and geometrical data for specified layout cell hierarchies of an integrated circuit (IC) design, e.g. a deep sub-micron IC design. The connectivity and geometrical data for each layout cell hierarchy are extracted at least in part in accordance with specified parasitic effect windows. In one embodiment, the data extraction tool includes a filtered extraction function that operates to extract connectivity and geometrical data for layout nets of each layout cell hierarchy of the IC design, one or more layout nets at a time. Additionally, one or more filtered databases are provided to store the filtered connectivity and geometrical data of the layout cell hierarchies.


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