The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2001
Filed:
Jun. 04, 1998
Takashi Yoneyama, Hachioji, JP;
Takashi Nagano, Tokyo, JP;
Hideaki Endo, Hachioji, JP;
Atsuhiro Tsuchiya, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope includes a stage on which a specimen is placed, a light source for illuminating the specimen, an objective lens for passing an illumination light from the specimen, an image formation system for forming an optical image of the specimen, a monitor for displaying as a visible picture the optical image of the specimen obtained from the image formation system, and an observation condition switch for switching the observation condition for the specimen from one to another. In particular, the optical axis extending from the light source to the image formation system is horizontal over the floor and various controls constituting the observation condition switch are mounted intensively on one side of a main body of the microscope.