The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2001

Filed:

Dec. 22, 1997
Applicant:
Inventors:

Yauh-Ching Liu, Sunnyvale, CA (US);

Gary K. Giust, Cupertino, CA (US);

Ruggero Castagnetti, San Jose, CA (US);

Subramanian Ramesh, Cupertino, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/13205 ; H01L 2/14763 ; H01L 2/141 ; H01L 2/18238 ;
U.S. Cl.
CPC ...
H01L 2/13205 ; H01L 2/14763 ; H01L 2/141 ; H01L 2/18238 ;
Abstract

Provided is a method of forming a silicide layer on the top and sidewall surfaces of a polysilicon gate/interconnect in a MOS transistor and on the exposed surfaces of the source and drain regions of the transistor. Devices produced according to the present invention may have different types of silicide formed on their gate and their source/drain electrodes. The invention achieves the advantages of silicide encapsulation of a polysilicon gate in an MOS transistor while also providing silicidation of the source/drain regions of the transistor, thereby reducing electrode resistivity in the transistor and interconnect.


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