The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2001
Filed:
Mar. 27, 1998
Konan Peck, Taipei, TW;
Jeremy J. W. Chen, Taipei, TW;
Pan-Chyr Yang, Taipei, TW;
Reen Wu, Davis, CA (US);
Fu Chang, Hsin Chu, TW;
Yi-Wen Chu, His Chih, TW;
Cheng-Wen Wu, Taipei, TW;
Academia Sinica, Taipei, TW;
Abstract
The invention relates to a method of detecting a differentially expressed gene in a first sample of nucleic acids representing a first population of RNA transcripts and a second sample of nucleic acids representing a second population of RNA transcripts. The nucleic acids in the samples are labled with a member of specific binding pair, and the labeled nucleic acids in each sample are then hybridized to an excess of copies of a gene-specific sequence. The hybridized nucleic acids in each sample are further labeled by binding a second member of the specific binding pair to the first member, in which the second member has an activity to convert a chromogenic substrate into a chromogen. As a result of contacting the second member with the chromogenic substrate, the chromogenic substrate is converted into the chromogen. A difference in the amounts of chromogen produced from assaying the two samples indicate that the gene-specific sequence is differentially expressed in the samples.