The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
Dec. 15, 1998
Applicant:
Inventors:
Bernhard H. Andresen, Dallas, TX (US);
Frederick G. Wall, Garland, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract
A test circuit (,) is provided to enable testing for faults in internal cascode transistors Q,and Q,, which form part of, for example, a level shifting circuit. Test circuit (,) is comprised of test transistors Q,and Q,connected to regulating transistors Q,and Q,. When Q,and Q,are functioning properly, no current flow through test circuit (,). If, however, either or both of Q,or Q,has a drain to source short, current flows through test circuit (,) thus providing an indication of the fault.