The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
Oct. 06, 1998
Satoshi Fujii, Itami, JP;
Yuichiro Seki, Itami, JP;
Kentaro Yoshida, Itami, JP;
Hideaki Nakahata, Itami, JP;
Kenjiro Higaki, Itami, JP;
Hiroyuki Kitabayashi, Itami, JP;
Tomoki Uemura, Itami, JP;
Shin-ichi Shikata, Itami, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Abstract
Surfaces of diamond crystals are examined by coating the surfaces with thin metal films, launching laser beams to the diamond surfaces in a slanting angle, detecting defects and particles on the diamond surfaces by the scattering of beams and counting the defects and particles by a laser scanning surface defect detection apparatus. Diamond SAW devices should be made on the diamond films or bulks with the defect density less than 300 particles cm,. Preferably, the diamond surfaces should have roughness less than Ra20 nm. Diamond SAW filters can be produced by depositing a piezoelectric film and making interdigital transducers on the low-defect density diamond crystals.