The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
Feb. 16, 1999
Applicant:
Inventors:
Michael Wörtge, Karlsruhe, DE;
Matthias Schüssler, Karlsbad-Spielberg, DE;
Assignee:
Polytec GmbH, Waldbronn, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01H 9/00 ;
U.S. Cl.
CPC ...
G01H 9/00 ;
Abstract
A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the object to be measured is scanned in the form of a grid. The position of the measurement points and the contour of the grid are freely selectable. Individual measurement point subquantities, to be analyzed respectively in correlation with one another, can be classified in different categories and analyzed as a function of the category to which they are assigned.