The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2001

Filed:

Mar. 29, 1999
Applicant:
Inventors:

Joe W. Zhao, San Jose, CA (US);

Wei-Jen Hsia, Sunnyvale, CA (US);

Wilbur G. Catabay, Saratoga, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/100 ;
Abstract

A process is provided for removing etch residues from one or more openings formed in one or more layers of a low dielectric constant insulation material over a copper metal interconnect layer of an integrated circuit structure which includes cleaning exposed portions of the surface of the copper interconnect layer at the bottom of the one or more openings, the process comprising providing an anisotropic hydrogen plasma to cause a chemical reaction between ions in the plasma and the etch residues in the bottom of the one or more opening, including copper oxide on the exposed copper surface, to thereby clean the exposed portions of the copper surface, and to remove the etch residues without sputtering the copper at the bottom of the opening.


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