The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Jan. 29, 1999
John Mark Oonk, San Ramon, CA (US);
Credence Systems Corporation, Fremont, CA (US);
Abstract
An integrated circuit tester includes a host computer, a pattern generator and a set of tester circuits for performing a series of tests on an integrated circuit. The pattern generator is programmed to supply a sequence of pattern data as input to the tester circuits for controlling their operations during each test of the series. The pattern generator may also be programmed to interrupt the host computer before or during any test whenever it is necessary for the host computer to carry out an activity. The host computer may be programmed to respond to an interrupt by writing parameter control data into the tester circuits to reconfigure their operating characteristics, by acquiring test results from the tester circuits, or by directly controlling tester circuit operations during a test. When necessary to provide sufficient time for the host computer to carry out its task, the pattern generator may be programmed to temporarily suspend supplying pattern data to the tester circuits after sending an interrupt.