The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2001
Filed:
Mar. 19, 1999
Takeshi Onishi, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An IC testing apparatus in which an accident occurring when a measurement part mounted on a test head is changed can be avoided. A type signal generating device,is provided on each of measurement parts so that a type signal TYPE can be sent from the type signal generating device,when a measurement part,is mounted on a test head,. The type signal is read by a type signal reading device,provided in an IC tester,. The type signal is transmitted to a handler,together with the number of simultaneous tests SUM extracted from a test program loaded in a main controller,of the IC tester. In the handler, a decision device,determines, based on the transmitted number of simultaneous tests and the type signal, whether or not the test program is proper and whether or not the arrangement of IC sockets set in the handler coincides with the arrangement of IC sockets of the measurement part. A start/stop controller,provided in the IC tester generates a start instruction to start a test when all of the decision results are “good”, or generates a stop-of-start instruction to prevent the IC tester from starting when even one of the decision results is “no-good”.