The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2001
Filed:
Apr. 30, 1999
Applicant:
Inventor:
Paul M. Gaschke, Wappinger Falls, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 1/300 ;
U.S. Cl.
CPC ...
H01R 1/300 ;
Abstract
A vertical probe for use in testing multiple chips carried on a wafer comprises a body of dielectric material having a testing surface and an output surface spaced from the testing surface. The dielectric body includes at least one chamber defining an opening in the output surface, and the rim of the opening is formed by a lip of the dielectric material. The device also includes multiple contacts which pass through the testing surface and which are snap fit in holes in the rim. A unibody construction for the dielectric body is described.