The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2001
Filed:
Jan. 20, 1999
Eric A. Swanson, Acton, MA (US);
Christopher L. Petersen, Carlisle, MA (US);
Lightlab Imaging, LLC, Westford, MA (US);
Abstract
An imaging system wherein an optical signal is transmitted to both a sample to be measured and a rotating element which is calibrated to the system. A return signal is detected by the system, and a scan analyzer and correction unit uses the system calibration information along with synchronization information to correct for return signal degradation or errors due to imperfections in the rotating element in real time. This allows for an accurate measurement of the sample. The system can also include a coarse path-length adjustment unit to allow the system to track a region of interest within a sample to further allow for accurate sample measurement.