The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
Apr. 30, 1998
Emanuel Gofman, Haifa, IL;
Franklin Gracer, Yorktown Heights, NY (US);
Ehud Dov Karnin, Koranit, IL;
Mark A. Lavin, Katonah, NY (US);
Dov Ramm, Menashe, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for calculating density maps in hierarchical designs includes the steps of deoverlapping objects in the design, providing an area of interest in the design, generating a grid in the area of interest to partition the area of interest into grid elements, determining whether the local properties of each object within the grid elements have been previously calculated, if previously calculated, adding the previously calculated value for the local properties to a corresponding grid element, otherwise, calculating the local properties of the object and summing the local properties of the objects for each associated grid element such that the local properties are calculated only once for a given object throughout the design. A system is also includes for implementing the method.