The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2001

Filed:

Jan. 05, 2000
Applicant:
Inventors:

Yukiharu Ohtsuka, Kawasaki, JP;

Yoshio Saruki, Kawasaki, JP;

Yoshio Moriya, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/03 ; G01B 5/14 ;
U.S. Cl.
CPC ...
G01B 5/03 ; G01B 5/14 ;
Abstract

A body,placed thereon with a table,put thereon with an object to be measured W, and a portal frame,supporting both ends of rail,to the body through pillars,A and,B, the rail being placed above the table,and extending along a moving direction of a pair of probes,A and,B, are provided. A pair of sliders,A and,B are movably supported by the rail,. The pair of the probes is extended downward from the sliders,A and,B to be abutted to the object W put on the table,. The flexural deformation of the probes,A and,B is decreased due to the shorter length of the probes,A and,B, so that the high accurate measurement is achieved and a relative measurement is omitted.


Find Patent Forward Citations

Ohtsuka, Yukiharu. (2001). Measuring instrument, probe for the same, and measuring method (U.S. Patent No. 6173504). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6173504

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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