The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Sep. 23, 1998
Applicant:
Inventor:
Kenichi Fujisaki, Gyoda, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract
A failure analysis memory operating at high speed comprises low speed DRAMS. The failure analysis memory comprises a data compression part reducing a number of writing operations of failure data if the same address is repeatedly accessed in close test cycles and if a failure occurs at that address. Use of the failure data compression part results in reduction of the number of writing operations of failure data, and thus decreases the amount of interleaving required of the failure analysis memory. The failure analysis memory, therefore, can be constructed using a reduced number of memory elements.