The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2001

Filed:

Oct. 01, 1997
Applicant:
Inventors:

Ji-hwan Liu, Cupertino, CA (US);

Ken Nguyen, San Jose, CA (US);

Karl S. Johnson, Palo Alto, CA (US);

Assignee:

Micron Technology, Inc., Nampa, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ; G06F 1/130 ;
U.S. Cl.
CPC ...
G06F 1/100 ; G06F 1/130 ;
Abstract

A system for reporting a failure condition in a server system which includes: a controller which monitors the server system for system failures, and generates an event signal and failure information if a system failure is detected; a system interface, coupled to the controller, which receives the event signal; a central processing unit, coupled to the system interface, wherein, upon receiving the event signal, the system interface reports an occurrence of an event to the central processing unit; and a system log which stores the failure information.


Find Patent Forward Citations

Liu, Ji-hwan. (2001). System for automatically reporting a system failure in a server (U.S. Patent No. 6170067). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6170067

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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