The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2001

Filed:

Aug. 28, 1998
Applicant:
Inventors:

Chen-Kuei Chung, Hsinchu, TW;

Chien-Chih Lee, Hsinchu, TW;

Ching-Yi Wu, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03C 5/00 ;
U.S. Cl.
CPC ...
G03C 5/00 ;
Abstract

An etching method for a semiconductor substrate to form a multi-level terraced structures is disclosed. A photomask is used to prepare a etching mask on a semiconductor substrate for a multi-level terraced structure. Said photomask has a pattern with a plurality of regions. Widths of the masked areas of the pattern are so designed that the etching rate of the etchant to respective parts of the substrate may be controlled, whereby a multi-level terraced structure with decided widths and heights of all levels may be prepared with one single photomask under one single etching step. This invention also discloses the photomask used in the etching method and products prepared according to the etching method.


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