The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2000

Filed:

Jul. 14, 1998
Applicant:
Inventors:

Meng-Jin Tsai, Hsinchu, TW;

Yimin Huang, Taichung Shien, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438636 ; 438618 ; 438620 ; 438622 ; 438629 ;
Abstract

A method for improving the damascene process window for metallization utilizes an anti-reflective coating to increase the precision of the photolithography process. An inter-layer dielectric and an anti-reflective layer are formed in turn on a semiconductor substrate. The inter-layer dielectric is patterned to form the interconnecting line regions. A conductive layer is then deposited on the semiconductor substrate and fills the interconnecting line regions. The chemical mechanical polish is performed to remove a portion of the conductive layer exceeding the interconnect line regions and simultaneously remove residual portion of said anti-reflective layer.


Find Patent Forward Citations

Tsai, Meng-Jin. (2000). Damascene process with anti-reflection coating (U.S. Patent No. 6156640). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6156640

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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