The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2000

Filed:

Jul. 16, 1998
Applicant:
Inventors:

Tetsuhiro Fukao, Tokyo, JP;

Yoshihiro Kusumi, Tokyo, JP;

Hiroshi Miyatake, Tokyo, JP;

Nobuo Fujiwara, Tokyo, JP;

Shigenori Sakamori, Tokyo, JP;

Satoshi Iida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438629 ; 438672 ; 256763 ;
Abstract

Provided are a method for manufacturing contact structure to prevent, in the wire of a borderless structure, erosion in the contact area between the wire and a conductor. An interlayer insulating film (300) having a wire burying hole is formed and a conductor (400) is buried in the hole. Then, a wire layer (500) covering the hole is formed on the interlayer insulating film (300). The wire layer (500) is made so as to have a borderless structure by using a resist (540) as a mask. A barrier metal layer (510) suppresses erosion in the contact area between the conductor (400) and the wire layer (500).


Find Patent Forward Citations

Fukao, Tetsuhiro. (2000). Method for manufacturing contact structure (U.S. Patent No. 6156639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6156639

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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