The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2000

Filed:

Jul. 06, 1998
Applicant:
Inventors:

Hiroshi Yamashiro, Kawasaki, JP;

Masashi Tsuboi, Kawasaki, JP;

Toshiharu Ozeki, Kawasaki, JP;

Hiroaki Kawada, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33832 ; 33836 ; 33706 ;
Abstract

Present invention relates to a measuring device which is capable of improving anti-vibration property and anti-impact property. The measuring device comprises a case 1, a spindle 11 displaceably provided to the case 1, a sensor on stationary side attached to the case 1 through a base 33 and a sensor on movable side formed on a scale 35 attached to the spindle 11, and a relative displacement amount of the two sensors 32 and 34 opposing at a predetermined gap G therebetween. A gap enlargement limiting pin 41 is provided on the side of the spindle 11 to restrict a fluctuation of the gap G caused by vibration of the spindle 11 and the like within a predetermined allowance, and a gap reduction limiting film 42 is provided to the sensor on stationary side 32.


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