The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2000
Filed:
Jun. 22, 1999
Applicant:
Inventor:
Seiichi Otsubo, Utsunomiya, JP;
Assignee:
Mitutoyo Corporation, Kanagawa-ken, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
33503 ; 33556 ; 33559 ;
Abstract
A measuring machine includes a probe mounting portion, a probe mounted on the probe mounting portion, for contacting a measuring surface of a workpiece, and a detector for detecting an amount of displacement of the probe as the probe moves in contact with the measuring surface of the workpiece. A cleaning device is provided at the probe mounting portion, with a nozzle for ejecting gas upon the measuring surface of the workpiece when the probe is positioned close to the measuring surface. A rotative driving device is provided for rotatively driving the cleaning device about the probe.