The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2000

Filed:

Mar. 25, 1998
Applicant:
Inventors:

Richard D Blinne, Fort Collins, CO (US);

Sudhir K Patel, Fort Collins, CO (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
703 14 ; 703 13 ;
Abstract

A method determines the behavior of a logic cell that receives input signals resulting in a narrow pulse or 'glitch.' If the pulse width of the output pulse is narrower than a pulse rejection period, the output pulse is rejected and is not propagated to subsequent logic cells connected to the output. The method employs a first internal logic cell model which is assigned an inertial delay function, and a second internal logic cell model which is assigned a transport delay function. In combination, the first and second logic cell models result in an effective propagation delay value, subject to the pulse rejection feature. An exemplary VHDL model is disclosed. A program product embodies a logic cell model in VHDL providing pulse rejection capabilities for output pulses with pulse width smaller than a pulse rejection period.


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