The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2000

Filed:

Oct. 02, 1997
Applicant:
Inventors:

Masahiro Tomoeda, Mitaka, JP;

Sakae Toyoda, Toyohashi, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06G / ;
U.S. Cl.
CPC ...
700170 ; 451-5 ; 451-8 ;
Abstract

A machine control gage system which is able to immediately recognize the cause of abnormal machining of a workpiece. The machine control gage system determines a change in the outer diameter of the workpiece during grinding, and outputs a control signal to a grinding machine controller when the measurement of the workpiece reaches a predetermined size. The machine control gage system is provided with a memory for containing measurement data obtained during grinding. By entering a predetermined command from a keyboard after machining, the measurement data relating to a specific workpiece can be retrieved from the memory, and the machining process can be repeatedly reproduced on a meter and/or a display means such as a bar-graph display. By fast-forwarding and slow-forwarding, the machining process can be monitored in further detail.


Find Patent Forward Citations

Tomoeda, Masahiro. (2000). Machine control gage system (U.S. Patent No. 6128547). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6128547

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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