The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2000

Filed:

Oct. 29, 1997
Applicant:
Inventor:

Shoichi Iwasa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257751 ; 257384 ; 257752 ; 257757 ; 257768 ;
Abstract

A polycide wiring layer constituted by a polysilicon film and a silicide film is used as a bit line of a DRAM. When a memory cell region having an n-type impurity diffusion layer and a peripheral circuit region having a p-type impurity diffusion layer are to be electrically connected through the polysilicon film, a diffusion prevention film consisting of TiSiN or WSiN is formed as an underlying film of the polysilicon film. With this diffusion prevention film, interdiffusion between the n- and p-type impurity diffusion layers can be prevented. In addition, heat resistance at 900.degree. C. or more can be obtained in processes after formation of the diffusion prevention film.


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