The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2000
Filed:
Jan. 28, 1999
Shoji Uchimura, Toyokawa, JP;
Hirohide Ishiguro, Toyokawa, JP;
Kazuhiro Ohta, Toyokawa, JP;
Manabu Takatsu, Toyokawa, JP;
Yasunobu Mizutani, Tokai, JP;
Sintokogio, Ltd., Nagoya, JP;
Abstract
An apparatus for testing the thermal shock fracture strength of ceramics. The apparatus includes supporting means for supporting a ceramic test piece shaped as a rectangular parallelepiped at a first side surface thereof, force-detecting means for restraining a predetermined location of a second side surface of the ceramic test piece, the second side surface facing the first side surface, the force-detecting means and the supporting means restraining any deformation of the ceramic test piece when the second side surface of the ceramic test piece is heated, the force-detecting means being adapted to detect a force acting on the force-detecting means from the ceramic test piece, which tends to be deformed, but which deformation is restrained, means for moving the supporting means to press the ceramic test piece against the force-detecting means, and a heat-emissive element, which is an electric heater, for covering and heating the second side surface to cause a thermal shock in the ceramic test piece.