The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2000

Filed:

Apr. 30, 1998
Applicant:
Inventors:

M Y Li, Hsin-Chu, TW;

L C Chen, Hsin-Chu, TW;

Y J Mii, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438255 ; 438253 ; 438396 ; 438398 ; 438690 ; 438964 ;
Abstract

The present invention discloses a method for forming a DRAM capacitor that has improved charge capacitance which can be carried out by first depositing an oxide layer on a semiconducting substrate, forming an uneven surface on the oxide layer, forming a capacitor node in the oxide layer to expose the substrate, depositing a polysilicon layer on top of the oxide layer and in the node such that the uneven surface on the oxide layer is substantially reproduced in a top surface of the polysilicon layer, depositing a dielectric layer and a second polysilicon layer sequentially on top of the first polysilicon layer to reproduce the uneven surface on the oxide layer, and then defining the DRAM capacitor.


Find Patent Forward Citations

Li, M. (2000). Method for forming a dram capacitor having improved capacitance and (U.S. Patent No. 6103571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6103571

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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