The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2000

Filed:

May. 13, 1998
Applicant:
Inventors:

Elliot Viches, Sunnyvale, CA (US);

Mostafa Mahmoudian, San Carlos, CA (US);

Jagdeep S Buttar, Union City, CA (US);

Oleg A Gergel, Mountain View, CA (US);

Patrick A Weber, Sunnyvale, CA (US);

Victor Rudman, Palo Alto, CA (US);

Harry Ray Duer, Boulder Creek, CA (US);

Assignee:

Read-Rite Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R / ;
U.S. Cl.
CPC ...
439817 ; 439835 ;
Abstract

An apparatus for testing magnetic heads that interact with magnetic disks includes a translational slide and a rotatable arm mounted to one end of the slide. The translational slide moves the rotatable arm in a longitudinal direction parallel to the surface of a magnetic disk. The arm rotates the magnetic head to different positions relative to data tracks on the disk. A second translational slide moves the magnetic head vertically above the disk to adjust the vertical position of the head. The three movements of the head, (1)horizontally across the disk, (2)rotationally by the arm, and (3)vertically relative to the disk surface are controlled by servomechanisms. A read/write amplifier circuit is connected to the head under test. The test apparatus is controlled by a computer that interfaces with circuitry connected to the servomechanisms.


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