The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2000
Filed:
Oct. 20, 1997
Hiroyuki Sakurai, Omiya, JP;
Yutaka Hayashibe, Omiya, JP;
Minoru Takeya, Omiya, JP;
Yasumasa Sayama, Omiya, JP;
Mitsubishi Materials Corporation, Tokyo, JP;
Abstract
A method of continuous flow analysis is provided which enables a plurality of color-forming components contained in a sample to be simultaneously analyzed with utmost ease. The method involves irradiating the sample with a measuring light which generates a wavelength having absorption bands with respect to such color-forming components, measuring the absorbance of each of the components in a color-formed state while the components are being adjusted stepwise in their color-forming state, and comparing the resultant absorbances of the components with each other. Preferably, a plurality of measuring cells are used to stepwise adjust the sample in its color-forming state, the measuring cells being connected in tandem such that a color former and/or a masking agent are incorporated in the sample while the latter is being caused to successively flow through these cells so that the sample is adjusted in its color-forming state at each of the measuring cells and measured in respect of its absorbances.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile