The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2000
Filed:
Jul. 29, 1996
Yuichi Yamada, Utsunomiya, JP;
Shigeyuki Uzawa, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A surface position detecting method, wherein, while an object having a region with a pattern structure is scanned relative to a surface position detecting system in a scan direction, different from a surface position detecting direction of the surface position detecting system, the surface position detecting system performs surface position detection sequentially at a plurality of detection points, which are disposed within the region and along the scan direction. The method includes steps of measuring beforehand errors to be produced with respect to the detection points due to a difference in pattern structure among the detection points disposed along the scan direction and correcting, when the surface position detection is sequentially performed by the surface position detecting system at the detection points along the scan direction while the object is scanned in the scan direction relative to the surface position detecting system, a result of the detection by the surface position detecting system at each detection point, on the basis of a measured error corresponding to that detection point, measured in the measuring step.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile