The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
Apr. 24, 1998
Robert Huston, San Jose, CA (US);
Daniel J Bedell, Portland, OR (US);
Credence Systems Corporation, Fremont, CA (US);
Abstract
A method of operating an integrated circuit (IC) tester is disclosed in which an IC is repeatedly tested with respect to a limited number of combinations of values of two variable IC operating parameters (X and Y) to determine the boundary of a two-dimensional range of combinations of values of the X and Y parameters for which the IC passes a test. After finding a combination of X and Y parameter values on the boundary, each combination of parameter values to be tested thereafter is selected by altering either the X or Y parameter value, with the decision based on whether the IC passed the last test and on the manner in which a last tested combination of X and Y parameter values was selected.