The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Dec. 31, 1997
Applicant:
Inventors:
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 25 ; 714 40 ; 714742 ;
Abstract
A tractable architecture level coverage measure uses information about the coverage measures obtained by the data path blocks, control logic blocks and cache to obtain an overall measure of coverage. This technique is applicable to a variety of different designs using different fabrication processes. Moreover, it allows the use of extended length test vectors, for example, such as those using commercial software applications. Since the coverage measure does not rely on the traditional stuck at model, it is applicable to extended length test vectors that may be used with high performance systems.