The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
May. 11, 1999
Michael A Marcus, Honeoye Falls, NY (US);
Donald R Lowry, Palmyra, NY (US);
Timothy M Trembley, Albion, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
An apparatus and method for calibrating an optical probe assembly, wherein the optical probe assembly includes a probe mounting surface and an optically transparent material spaced from the probe mounting surface. The method includes providing a calibration apparatus, wherein the calibration apparatus includes a calibration mount having an axis and a reference surface on an exterior surface of the calibration mount. A calibration target is mounted substantially perpendicular to the calibration mount axis at a predetermined distance from the calibration mount reference surface, and a distance LR from the calibration target to the calibration mount reference surface is determined. The optical probe assembly is then removably mounted and lockably secured to the calibration apparatus such that the calibration mount reference surface is in a predetermined orientation relative to the probe mounting surface on the optical probe assembly. Non-coherent light interferometry is used to determine a distance PR from the optically transparent material to the calibration target, and a distance LP from the probe mounting surface to the optically transparent material using the values of LR and PR is determined.