The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Feb. 21, 1997
Stephen Charles Minne, Danville, IL (US);
Calvin F Quate, Stanford, CA (US);
Scott Manalis, Stanford, CA (US);
The Board of Trustees of the Leland Stanford, Jr. University, Stanford, CA (US);
Abstract
A probe for a scanning probe microscope includes a cantilever having a length defined between a free end and a base end. The base end is connected to a support. The free end includes a sharp tip, and is free to oscillate at a selected frequency. The probe also includes a knife-edge structure that is positioned adjacent to the cantilever and perpendicular to the length of the cantilever. The knife edge inhibits the cantilever from vibrating at a first-order resonant frequency of the cantilever, and instead encourages the cantilever to vibrate at third or higher order resonant frequencies.