The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2000

Filed:

Mar. 17, 1998
Applicant:
Inventors:

Jun Takaya, Mitaka, JP;

Kazumi Ikeda, Mitaka, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B / ;
U.S. Cl.
CPC ...
451 41 ; 451398 ; 451903 ;
Abstract

The peripheral edge of a wafer is cramped by four cramp rollers which are able to move forward and backward with respect to a reference point, and thereby, the center of the wafer is positioned at the reference point. Then, a notch pin, which is provided on a reference line, is pressed against the peripheral edge of the wafer, and the wafer is rotated about the reference point. Thereby, a notch on the wafer moves to the notch pin, and then, the notch pin fits into the notch. Thus, the wafer is positioned at a predetermined position.


Find Patent Forward Citations

Takaya, Jun. (2000). Wafer positioning method and apparatus (U.S. Patent No. 6062953). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6062953

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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