The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2000

Filed:

Jan. 26, 1998
Applicant:
Inventor:

Wataru Doi, Gyoda, JP;

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
324 7627 ; 324 7623 ; 324617 ; 342 20 ; 73659 ;
Abstract

A spectrum analyzer measures a time difference between two or more signals with different carrier frequencies or a time delay between two or more signals with the same carrier frequency. The spectrum analyzer includes at least two measurement channels, each of the measurement channels has a frequency mixer, a local oscillator and an IF (intermediate frequency) filter for mixing an input signal to be measured with a local signal of the local oscillator to produce an IF signal which passes through the IF filter, and a demodulator provided in one of the measurement channels to demodulate the IF signal produced from the input signal to generate a trigger signal to start an operation of the other measurement channel.


Find Patent Forward Citations

Doi, Wataru. (2000). Spectrum analyzer (U.S. Patent No. 6060878). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6060878

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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