The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2000
Filed:
Jun. 30, 1998
Applicant:
Inventor:
Mark Edward Secrest, Vancouver, WA (US);
Assignee:
Seh America, Inc., Vancouver, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 70 ; 378 71 ; 378 73 ; 378 76 ;
Abstract
A method for identifying desired features in an off-orientation crystal uses radiation, such as x-rays, directed toward the crystal in a first direction to detect a unique region in a first direction. Based on identifying the unique region, the location of a desired feature, such as a key growth line, is approximated. Radiation is then directed at the crystal in a second direction transverse to the first direction to determine the precise location of the desired feature. The method can be performed automatically by a programmed x-ray device.