The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2000

Filed:

Nov. 25, 1998
Applicant:
Inventors:

Takashi Yoneyama, Hachioji, JP;

Kenji Karaki, Ina, JP;

Kazuo Kajitani, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359381 ; 359389 ; 2503013 ;
Abstract

A microscope includes a light source for emitting light, a light condenser lens for condensing the light from the light source onto an object, a wavelength selection unit arranged between the light source and the light condenser lens for selecting the wavelength of the light entering the light condenser lens from the light source, a detector for detecting light from the object through the light condenser lens, and an optical path length adjusting unit arranged between the light source and the detector for adjusting the optical path length between the light condenser lens and the detector in order to correct the chromatic aberration of the light condenser lens appearing depending on the wavelength of the light selected by the wavelength selection unit.


Find Patent Forward Citations

Loading…