The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2000

Filed:

Nov. 24, 1998
Applicant:
Inventors:

Shunichi Sukegawa, Plano, TX (US);

Shinji Bessho, Plano, TX (US);

Tadashi Tachibana, Miho-mura, JP;

Hiroyuki Yoshida, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
3652335 ; 365207 ; 36518909 ;
Abstract

A semiconductor memory device has an address buffer (200, 230). A pre-decoder circuit (202, 232) receives the output of the address buffer (200, 230), and a memory array (212) receives the output of the pre-decoder circuit. A main amplifier (216, 248) in turn receives the output of the memory array (212, 244). An address transition detector (ATD) pulse generator circuit (204, 234) also receives the output of the address buffer (200, 230), and a pulse delay circuit (208, 240) receives the output of the address transition detector pulse generator circuit (204, 234). The pulse delay circuit (208, 240) also provides a main amplifier signal to the main amplifier (216, 248). The memory device further includes a voltage generator (206, 236) that generates a back gate voltage which is provided as a low voltage supply (V.sub.BB) for the address transition detector (ATD) pulse generator circuit (204, 234) and the pulse delay circuit (208, 240). The address transition detector (ATD) pulse generator (204, 234) and the pulse delay circuit (208, 240) have a delay that is controlled by the back gate voltage (V.sub.BB) and has a reduced dependency on a high voltage supply (V.sub.DD) of the memory device.


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