The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 29, 2000
Filed:
Oct. 18, 1995
Kazuo Nakaizumi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A tester for integrated circuits, includes a testing set for supplying inputs for operating an integrated circuit to be tested and for measuring outputs of the integrated circuit to be tested, a semiconductor chip or wafer formed with at least some of the functions of the testing set, and a contact member through which the semiconductor chip or wafer is to come into electrical contact with the integrated circuit to be tested. Thus, it is not necessary to transmit test signals from the testing set, and hence it is possible to simplify the expensive hardware necessary for transmitting the test signals. As a result, the cost of the tester is markedly reduced.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile