The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2000
Filed:
Aug. 03, 1998
Naoki Kawahara, Takatsuki, JP;
Rigaku Industrial Corporation, Osaka, JP;
Abstract
An X-ray analyzing apparatus includes a drive unit for moving a sample, a plurality of field-limiting slits each having a slit size corresponding to the size of a measuring area of the sample, a selector unit for selectively bringing the field-limiting slits into a path of travel of the secondary X-ray between the sample and the detecting unit, a drive controller for controlling the drive unit to move the sample according to the size of the measuring area of the sample to a position at which the intensity of radiation of a primary X-ray towards the measuring area of the sample attains a maximum value; and a selector controller for controlling the selector unit to render only the secondary X-ray emanating from the measuring area of the sample to be incident upon the detecting unit.