The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2000
Filed:
Dec. 21, 1998
Applicant:
Inventors:
Kim Alvin Marshall, St. Joseph, MI (US);
Peter Markel Willis, Benton Harbor, MI (US);
Assignee:
Leco Corporation, St. Joseph, MI (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356328 ;
Abstract
A detection system for an atomic emission spectrometer includes a spherical convex diffraction grating having a radius of curvature which is one-half the radius of curvature of a pair of concave spherical mirrors. The diffraction grating and mirrors are positioned within a chamber such that their centers of curvature coincide at the focal plane to which a plurality of relatively small spaced-apart linear detectors are positioned on opposite sides of an emission entry slit to provide detection of alternate segments of a spectral band of wavelengths of interest.